Please use this identifier to cite or link to this item: http://repositorio.unicamp.br/jspui/handle/REPOSIP/99792
Type: Artigo de periódico
Title: Strain Measurements In Inxga1-xas/gaas Strained-layer Superlattices By Photomodulated Reflectance
Author: Lemos V.
Vazquez-Lopez C.
Cerdeira F.
Abstract: We performed a series of Raman and photoreflectance measurements on several InxGa1-xAs/GaAs strained layer superlattices of the same period but of different alloy compositions and substrate orientations. Both types of measurements are used in order to estimate the in-plane strain in these layers. The values obtained by both methods are in good mutual agreement, thus showing that photoreflectance is an effective method for strain determination. © 1993 Academic Press. All rights reserved.
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Rights: fechado
Identifier DOI: 10.1006/spmi.1993.1036
Address: http://www.scopus.com/inward/record.url?eid=2-s2.0-44949266219&partnerID=40&md5=4b36c505eca312bc6f3a39150ef60770
Date Issue: 1993
Appears in Collections:Unicamp - Artigos e Outros Documentos

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