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Type: Artigo de periódico
Title: Strain Measurements In Inxga1-xas/gaas Strained-layer Superlattices By Photomodulated Reflectance
Author: Lemos V.
Vazquez-Lopez C.
Cerdeira F.
Abstract: We performed a series of Raman and photoreflectance measurements on several InxGa1-xAs/GaAs strained layer superlattices of the same period but of different alloy compositions and substrate orientations. Both types of measurements are used in order to estimate the in-plane strain in these layers. The values obtained by both methods are in good mutual agreement, thus showing that photoreflectance is an effective method for strain determination. © 1993 Academic Press. All rights reserved.
Rights: fechado
Identifier DOI: 10.1006/spmi.1993.1036
Date Issue: 1993
Appears in Collections:Unicamp - Artigos e Outros Documentos

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