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Type: Artigo de periódico
Title: Electroreflectance Study Of The E1 And E0 Optical Transitions In Thin Ge/si Superlattices
Author: Rodrigues P.A.M.
Cerdeira F.
Cardona M.
Kasper E.
Kibbel H.
Abstract: We report low temperature (77 K) eletroreflectance measurements on a series of GenSim strain-symmetrized superlattices. The results obtained for samples with n + m ≤ 10 are consistent with band structure calculations performed using the linear muffin-tin orbitals method as well as data from previous ellipsometric measurements. Results for superlattices with n + m ≥ 20 can be explained by a straightforward extension of this conceptual scheme. © 1993.
Rights: fechado
Identifier DOI: 10.1016/0038-1098(93)90830-G
Date Issue: 1993
Appears in Collections:Unicamp - Artigos e Outros Documentos

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