Please use this identifier to cite or link to this item: http://repositorio.unicamp.br/jspui/handle/REPOSIP/99662
Type: Artigo de periódico
Title: Electroreflectance Study Of The E1 And E0 Optical Transitions In Thin Ge/si Superlattices
Author: Rodrigues P.A.M.
Cerdeira F.
Cardona M.
Kasper E.
Kibbel H.
Abstract: We report low temperature (77 K) eletroreflectance measurements on a series of GenSim strain-symmetrized superlattices. The results obtained for samples with n + m ≤ 10 are consistent with band structure calculations performed using the linear muffin-tin orbitals method as well as data from previous ellipsometric measurements. Results for superlattices with n + m ≥ 20 can be explained by a straightforward extension of this conceptual scheme. © 1993.
Editor: 
Rights: fechado
Identifier DOI: 10.1016/0038-1098(93)90830-G
Address: http://www.scopus.com/inward/record.url?eid=2-s2.0-0027609166&partnerID=40&md5=a64522ac5b89f1325fb9526fe7c0d366
Date Issue: 1993
Appears in Collections:Unicamp - Artigos e Outros Documentos

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