Please use this identifier to cite or link to this item: http://repositorio.unicamp.br/jspui/handle/REPOSIP/99317
Type: Artigo de periódico
Title: Hydrogen Diffusion In Rf-sputtered A-ge: H Thin Films
Author: de O. Graeff C.F.
Freire Jr. F.L.
Chambouleyron I.
Abstract: Hydrogen diffusion experiments on a-Ge:H films were studied using the Elastic Recoil Detection (ERD) technique and infrared (IR) transmission spectra. The results indicate two kinds of diffusion processes: one due to the desorption of molecular hydrogen through microvoids and another due to dispersive-like diffusion of H atoms in the amorphous network. The dispersive parameter, To, related to the exponential distribution of energy barriers giving rise to dispersive diffusion, is found to be 1400 K. The constant distance diffusion coefficient is temperature activated with an activation energy of 0.4 ± 0.2 eV. A possible correlation between hydrogen diffusion and light-induced metastability in a-Ge:H is discussed. © 1991 Elsevier Science Publishers B.V. All rights reserved.
Editor: 
Rights: fechado
Identifier DOI: 10.1016/S0022-3093(05)80052-3
Address: http://www.scopus.com/inward/record.url?eid=2-s2.0-17144443700&partnerID=40&md5=1c2cc899f38b3cb8e0435c42a718f0fe
Date Issue: 1991
Appears in Collections:Unicamp - Artigos e Outros Documentos

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