Please use this identifier to cite or link to this item: http://repositorio.unicamp.br/jspui/handle/REPOSIP/99299
Type: Artigo de periódico
Title: Hybrid Multiple Diffraction In Renninger Scan For Heteroepitaxial Layers
Author: Morelhao S.L.
Cardoso L.P.
Sasaki J.M.
De Carvalho M.M.G.
Abstract: In this paper, we report the successful observation of the hybrid multiple diffraction (hybrid MD) in Renninger scans (RS) [M. Renninger, Z. Kristallogr. 106, 141 (1937)]. These diffractions occur when the beam first diffracted by an inclined layer (or substrate) plane with respect to the sample surface crosses the interface layer/substrate to be rescattered by another substrate (or layer) plane towards the detector. The construction of an incidence diagram allows to establish the occurrence of the hybrid MD for heteroepitaxial layers. The layer imperfection (mosaic spread) is used to explain these extra features in RS together along the normal MD features. The case of a GaAs layer grown on a Si substrate is investigated.
Editor: 
Rights: aberto
Identifier DOI: 10.1063/1.349367
Address: http://www.scopus.com/inward/record.url?eid=2-s2.0-0040798641&partnerID=40&md5=1e1d8a7230fb07d56bd50dd0bad847b3
Date Issue: 1991
Appears in Collections:Unicamp - Artigos e Outros Documentos

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