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Type: Artigo de periódico
Title: Conceptual Design Of Instrumentation To Measure The Diffraction Profile Of A Single Crystal At Bragg Angle Near π 2 By Using Synchrotron Radiation
Author: Caticha-Ellis S.
Boyce R.
Winick H.
Abstract: X-ray diffraction at nearly normal incidence is becoming an increasing important tool in several applications. Because the source of synchrotron radiation, an electron beam in a magnetic field in vacuum, is transparent to X-rays back-reflected through it, one can measure X-ray profiles at normal and near-normal incidence. A back-tangent port must be provided to allow a back-reflected beam to leave the storage ring. The concept can be applied to a bending-magnet or insertion-device source. Since the back-reflected beam is a low-power monochromatic beam, the front end, beryllium window, and other components of the back-tangent port can be simplified. It may be possible to merely drill a hole through the concrete shielding wall leading into a hutch for the detector. Possible arrangements for the SPEAR and Positron-Electron Project rings at the Stanford Synchrotron Radiation Laboratory (SSRL) are presented. © 1990.
Rights: fechado
Identifier DOI: 10.1016/0168-9002(90)90047-A
Date Issue: 1990
Appears in Collections:Unicamp - Artigos e Outros Documentos

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