Please use this identifier to cite or link to this item: http://repositorio.unicamp.br/jspui/handle/REPOSIP/98927
Type: Artigo de periódico
Title: Laser Beam Deflection System For Measuring Stress Variations In Thin Film Electrodes
Author: Sahu S.N.
Scarminio J.
Decker F.
Abstract: The bending beam method for measurements of stress in thin films deposited on an elastic substrate in the form of a thin stripe has been improved by the introduction of a laser beam deflection system and of a laser spot position detector. With this improvement, stress measurements have been performed in situ during the electrochemical reactions of palladium hydride formation and of valve metal anodic oxidation. Stress changes in the thin films of 107 N/m2 can be measured with a time response better than 1s. This allows the detection of rapid reactions (like H diffusion in a Pd thin film) and of the electrostriction effect even in anodic films with thickness below 20 nm.
Editor: 
Rights: aberto
Identifier DOI: 
Address: http://www.scopus.com/inward/record.url?eid=2-s2.0-0025419528&partnerID=40&md5=9dc4407264e4058992a6535f883b444b
Date Issue: 1990
Appears in Collections:Unicamp - Artigos e Outros Documentos

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