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|Type:||Artigo de periódico|
|Title:||Determination Of The Three-dimensional Lattice Mismatch In Quaternary Iii-v Liquid Phase Epitaxial Layers Using Simultaneous Bragg Diffraction Of X-rays|
|Abstract:||Because multiple simultaneous reflection of x rays is very sensitive to lattice deformation, the six-beam, (000) (006) (22̄4) (22̄2) (2̄24) (2̄22) multiple reflection was used to record simultaneously the information about the lattice mismatch of  InGaAsP materials using a divergent x-ray source. The lattice mismatches in directions parallel and perpendicular to , determined from a single divergent-beam photograph, increase as the As concentration in liquid composition Xl As increases. The procedure was used without difficulty for X l Ga as low as 0.0007 and Xl As in the range 0.006-0.01.|
|Appears in Collections:||Unicamp - Artigos e Outros Documentos|
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