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|Type:||Artigo de periódico|
|Title:||X-ray Interference By Division Of Wave Front - A New X-ray Interferometer|
|Abstract:||An x-ray interference pattern is observed for the first time by division of the wave front at one piece of a single crystal. The (220) reflection from a V-shaped silicon crystal and a synchrotron radiation source are used. The crystal, acting simultaneously as a beam splitter, mirror, and analyzer, represents a novel single-leaf x-ray interferometer.|
|Appears in Collections:||Unicamp - Artigos e Outros Documentos|
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