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|Type:||Artigo de evento|
|Title:||Speckle Pattern Direct Photographic Correlation For Measuring Surface Roughness|
|Abstract:||The absolute measurement of the intensity correlation of a speckle pattern was previously demonstrated by using a photographic real-time technique (1). In this paper we demonstrate its use for the measurement of surface roughness in the 1-30,μm range, achieving many practical advantages over the two versions of a previous similar technique (2)(3).|
|Appears in Collections:||Unicamp - Artigos e Outros Documentos|
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