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Type: Artigo de evento
Title: Speckle Pattern Direct Photographic Correlation For Measuring Surface Roughness
Author: Sthel M.S.
Lunazzi J.J.
Hogert E.N.
Gaggioli N.G.
Abstract: The absolute measurement of the intensity correlation of a speckle pattern was previously demonstrated by using a photographic real-time technique (1). In this paper we demonstrate its use for the measurement of surface roughness in the 1-30,μm range, achieving many practical advantages over the two versions of a previous similar technique (2)(3).
Editor: SPIE
Rights: aberto
Identifier DOI: 10.1117/12.967396
Date Issue: 1987
Appears in Collections:Unicamp - Artigos e Outros Documentos

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