Please use this identifier to cite or link to this item: http://repositorio.unicamp.br/jspui/handle/REPOSIP/98285
Type: Artigo de evento
Title: Speckle Pattern Direct Photographic Correlation For Measuring Surface Roughness
Author: Sthel M.S.
Lunazzi J.J.
Hogert E.N.
Gaggioli N.G.
Abstract: The absolute measurement of the intensity correlation of a speckle pattern was previously demonstrated by using a photographic real-time technique (1). In this paper we demonstrate its use for the measurement of surface roughness in the 1-30,μm range, achieving many practical advantages over the two versions of a previous similar technique (2)(3).
Editor: SPIE
Rights: aberto
Identifier DOI: 10.1117/12.967396
Address: http://www.scopus.com/inward/record.url?eid=2-s2.0-0005024207&partnerID=40&md5=1fc4c445475ece07a482ecaeb531be50
Date Issue: 1987
Appears in Collections:Unicamp - Artigos e Outros Documentos

Files in This Item:
File SizeFormat 
2-s2.0-0005024207.pdf71.54 kBAdobe PDFView/Open


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.