Please use this identifier to cite or link to this item:
|Type:||Artigo de periódico|
|Title:||Stress-induced G-anisotropy Of Er In Ag Thin Films|
|Abstract:||ESR of diluted Er in epitaxially growth Ag  single crystal thin films has been measured. The Er resonance was found to have anisotropic g-value. This anisotropy was interpreted in terms of induced strains on the film by the substrate. The second order orbit-lattice coupling trigonal parameter was estimated. Its sign was found to be in disagreement to that predicted by the point dipole model. © 1977.|
|Appears in Collections:||Unicamp - Artigos e Outros Documentos|
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.