Please use this identifier to cite or link to this item: http://repositorio.unicamp.br/jspui/handle/REPOSIP/97625
Type: Artigo de periódico
Title: Determination Of Lattice Mismatch In Ga1-xalxas Lpe Layer On Gaas Substrate By Using A Divergent X-ray Source
Author: Chang S.-L.
Patel N.B.
Nannichi Y.
De Prince F.C.
Abstract: A new method of determining lattice mismatch in LPE heterojunction systems has been developed by utilizing a divergent x-ray source. The experimental arrangements and operation procedures are much simpler than those of the usual x-ray methods.
Editor: 
Rights: aberto
Identifier DOI: 10.1063/1.326179
Address: http://www.scopus.com/inward/record.url?eid=2-s2.0-0018458454&partnerID=40&md5=4c7ff0b301e66935eb7c88122befcae3
Date Issue: 1979
Appears in Collections:Unicamp - Artigos e Outros Documentos

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