Please use this identifier to cite or link to this item:
Type: Artigo de periódico
Title: Determination Of Lattice Mismatch In Ga1-xalxas Lpe Layer On Gaas Substrate By Using A Divergent X-ray Source
Author: Chang S.-L.
Patel N.B.
Nannichi Y.
De Prince F.C.
Abstract: A new method of determining lattice mismatch in LPE heterojunction systems has been developed by utilizing a divergent x-ray source. The experimental arrangements and operation procedures are much simpler than those of the usual x-ray methods.
Rights: aberto
Identifier DOI: 10.1063/1.326179
Date Issue: 1979
Appears in Collections:Unicamp - Artigos e Outros Documentos

Files in This Item:
File Description SizeFormat 
2-s2.0-0018458454.pdf467.03 kBAdobe PDFView/Open

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.