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|Type:||Artigo de periódico|
|Title:||A-siox<er> Active Photonic Crystal Resonator Membrane Fabricated By Focused Ga+ Ion Beam|
|Abstract:||We have fabricated thin erbium-doped amorphous silicon suboxide (a-SiOx<Er>) photonic crystal membrane using focused gallium ion beam (FIB). The photonic crystal is composed of a hexagonal lattice with a H1 defect supporting two quasi-doubly degenerate second order dipole states. 2-D simulation was used for the design of the structure and full 3-D FDTD (Finite-Difference Time-Domain) numerical simulations were performed for a complete analysis of the structure. The simulation predicted a quality factor for the structure of Q = 350 with a spontaneous emission enhancement of 7. Micro photoluminescence measurements showed an integrated emission intensity enhancement of ∼2 times with a Q = 130. We show that the discrepancy between simulation and measurement is due to the conical shape of the photonic crystal holes and the optical losses induced by FIB milling. © 2012 Optical Society of America.|
|Editor:||Optical Society of American (OSA)|
|Appears in Collections:||Unicamp - Artigos e Outros Documentos|
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