Please use this identifier to cite or link to this item: http://repositorio.unicamp.br/jspui/handle/REPOSIP/96520
Type: Artigo de periódico
Title: Measurement Of Spontaneous Carrier Lifetime From Stimulated Emission Delays In Semiconductor Lasers
Author: Ripper J.E.
Abstract: An analysis of the delay between the beginning of the excitation of a semiconductor laser and the onset of stimulated emission is carried out. It justifies the use of these delays as a method of measuring the spontaneous carrier lifetime, even when this lifetime is not the same for all carriers. It is also shown that the lifetime thus measured is the average lifetime of all carriers when the population inversion is at the threshold level. © 1972 The American Institute of Physics.
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Rights: aberto
Identifier DOI: 10.1063/1.1661391
Address: http://www.scopus.com/inward/record.url?eid=2-s2.0-0015326341&partnerID=40&md5=323e77d7bdbf81e90514824a59488924
Date Issue: 1972
Appears in Collections:Unicamp - Artigos e Outros Documentos

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