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|Type:||Artigo de periódico|
|Title:||Characterization Of Different Length Scales And Periodicities In Ge/si Microstructures By Raman Spectroscopy : Theory And Experiment|
|Author:||Araujo Silva M.A.|
|Abstract:||The Raman spectra of samples of the type [(GenSim) N - 1 Gen SiMl x p with n ≈ m ≈ 5 monolayers, M ≈ 200 monolayers and p ≈ 10-20 were measured in the backscattering configuration in the wavenumber range 2-600 cm-1. The experimental results are discussed by comparison with simulated spectra calculated with a linear chain model with bond polarizabilities for the Raman intensities. Comparison between experimental and theoretical spectra gives insights into the sensitivity of the different Raman peaks as a probe of periodicity and interface roughness length scales.|
|Appears in Collections:||Unicamp - Artigos e Outros Documentos|
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