Please use this identifier to cite or link to this item: http://repositorio.unicamp.br/jspui/handle/REPOSIP/95458
Type: Artigo de evento
Title: Growth And Characterization Of Optical Grade Synthetic Quartz
Author: Suzuki Carlos K.
Tanaka Marcos S.
Shinohara Armando H.
Abstract: A method to position the seed and Z-region of growth out of the circulating micro-particle flux in commercial autoclave has been used to grow optical grade synthetic quartz. The number of solid inclusions is in the range of 0.02 - 0.03 particles/cm3, depending on the bar. The observation of X-ray topographic contrast of (0003) reflection shows a much smaller Z-region lattice spacing (strain) in comparison with the seed. The dislocation lines are in their totality originated by the seed etch-channels, that means, they can be eliminated by using a better quality seed.
Editor: IEEE, Piscataway, NJ, United States
Rights: fechado
Identifier DOI: 
Address: http://www.scopus.com/inward/record.url?eid=2-s2.0-0030412544&partnerID=40&md5=606ef271e119738bcaa88269d3e2388d
Date Issue: 1996
Appears in Collections:Unicamp - Artigos e Outros Documentos

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