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|Type:||Artigo de evento|
|Title:||X-ray Magnetic Circular Dichroism In Fe/nio Thin Films|
|Abstract:||The interface of thin films of Fe/NiO (1 0 0)-oriented single crystals was studied by X-ray magnetic circular dichroism (XMCD). Thin layers of Fe were removed by "in situ" sputtering, followed by XMCD measurements, resulting in a depth profile. A decrease from the bulk value in the value of the Fe moment at the interface of Fe with the antiferromagnetic NiO(1 0 0) was observed. © 2001 Elsevier Science B.V.|
|Appears in Collections:||Unicamp - Artigos e Outros Documentos|
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