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Type: Artigo de evento
Title: X-ray Magnetic Circular Dichroism In Fe/nio Thin Films
Author: Alvarenga A.D.
Garcia F.
Sampaio L.C.
Giles C.
Yokaichiya F.
Achete C.A.
Simao R.A.
Guimaraes A.P.
Abstract: The interface of thin films of Fe/NiO (1 0 0)-oriented single crystals was studied by X-ray magnetic circular dichroism (XMCD). Thin layers of Fe were removed by "in situ" sputtering, followed by XMCD measurements, resulting in a depth profile. A decrease from the bulk value in the value of the Fe moment at the interface of Fe with the antiferromagnetic NiO(1 0 0) was observed. © 2001 Elsevier Science B.V.
Rights: fechado
Identifier DOI: 10.1016/S0304-8853(01)00231-1
Date Issue: 2001
Appears in Collections:Unicamp - Artigos e Outros Documentos

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