Please use this identifier to cite or link to this item: http://repositorio.unicamp.br/jspui/handle/REPOSIP/94052
Type: Artigo de evento
Title: Carbon Nanotube Probe Resolution: A Quantitative Analysis Using Fourier Transform
Author: Gutierrez H.R.
Nakabayashi D.
Silva P.C.
Bortoleto J.R.R.
Rodrigues V.
Clerici J.H.
Cotta M.A.
Ugarte D.
Abstract: A method to quantify the resolution of atomic force microscopy (AFM) probes using Fourier analysis of the AFM images is proposed. The maximum detectable spatial frequency obtained from the power spectrum was used to estimate the lateral resolution. Carbon nanotube tips were successfully used to study very dense arrays of semiconductor nanostructures. In particular, accurate measurements of shallow facet angles were obtained, which are in perfect agreement with results obtained by two complementary techniques - High Resolution Transmission Electron Microscopy and Reflection High-Energy Electron Diffraction. © 2004 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
Editor: 
Rights: fechado
Identifier DOI: 10.1002/pssa.200304369
Address: http://www.scopus.com/inward/record.url?eid=2-s2.0-2442617187&partnerID=40&md5=c7836551310038ee0f7983f3cbb31378
Date Issue: 2004
Appears in Collections:Unicamp - Artigos e Outros Documentos

Files in This Item:
File Description SizeFormat 
2-s2.0-2442617187.pdf306.89 kBAdobe PDFView/Open


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.