Please use this identifier to cite or link to this item: http://repositorio.unicamp.br/jspui/handle/REPOSIP/93615
Type: Artigo de periódico
Title: Atomic Force Microscopy Applied To The Study Of Dewetting Patterns Of Thin Films From Polymer Solutions
Author: Rezende C.A.
Lee L.-T.
Galembeck F.
Abstract: Stable and defect-free films are required for many technological applications, while controlled dewetting processes are important for producing thin film microstructuring for microelectronics, optical devices and biochip technology. In this work, we study the dewetting features formed by drying an aqueous solution of a charged polymer deposited on a mica substrate. A rich variety of morphologies can be formed, including holes, polygonal networks, droplets and elongated structures. The dewetting behavior depends on film thickness and on the charge density on the polymer that can be controlled by surfactant addition. The various nanoscale morphological patterns that are formed may be applied as a potential method for surface nanostructuring. Copyright 2005, LASPM.
Editor: 
Rights: fechado
Identifier DOI: 10.1017/S1431927605051019
Address: http://www.scopus.com/inward/record.url?eid=2-s2.0-33750727701&partnerID=40&md5=013c60ce19cee574cef390d24f2a5663
Date Issue: 2005
Appears in Collections:Unicamp - Artigos e Outros Documentos

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