Please use this identifier to cite or link to this item: http://repositorio.unicamp.br/jspui/handle/REPOSIP/89980
Type: Artigo de periódico
Title: Irradiation Induced Modification In Transport Properties Of Lanio 3 Thin Films: An X-ray Absorption Study
Author: Kumar Y.
Pratap Singh A.
Sharma S.K.
Choudhary R.J.
Thakur P.
Knobel M.
Brookes N.B.
Kumar R.
Abstract: Highly c-axis oriented LaNiO 3 thin films are grown on LaAlO 3 (001) single crystal substrates using rf-magnetron sputtering. Swift heavy ion irradiation induced variations in structural and electrical transport properties of deposited films are studied. Pristine film shows unusual insulating character while the irradiated film exhibits metallic behaviour. X-ray diffraction study indicates that irradiation improves the crystalline character of films while retaining the oriented single phase growth. Electronic structure measurements performed using x-ray absorption spectroscopy at O K, La M 5,4, and Ni L 3,2-edges reveal that Ni-O hybridization-controlled localization of charge carriers is responsible for the observed transport behaviour. © 2012 American Institute of Physics.
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Rights: aberto
Identifier DOI: 10.1063/1.4752005
Address: http://www.scopus.com/inward/record.url?eid=2-s2.0-84866328972&partnerID=40&md5=bb756064f5e6d864c72e7c4811af2a22
Date Issue: 2012
Appears in Collections:Unicamp - Artigos e Outros Documentos

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