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|Type:||Artigo de periódico|
|Title:||A Comparison Between Geant4 Pixe Simulations And Experimental Data For Standard Reference Samples|
El Bast M.
El Haddad R.
El Bitar Z.
|Abstract:||The Geant4 PIXE de-excitation processes are used to simulate proton beam interactions with sample materials of known composition. Simulations involve four mono-elemental materials; Cu, Fe, Si and Al and three relatively complex materials: stainless steel, phosphor bronze and basal BE-N reference material composed of 25 different elements. The simulation results are compared to experimental spectra acquired for real samples analyzed using 3 MeV incident protons delivered by an ion tandem accelerator. Data acquisition was performed using a Si(Li) detector and an aluminum funny filter was added for the three last mentioned samples depending on the configuration to reduce the noise and obtain clear resulting spectrum. The results show a good agreement between simulations and measurements for the different samples. © 2013 Elsevier B.V. All rights reserved.|
|Appears in Collections:||Unicamp - Artigos e Outros Documentos|
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