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|Type:||Artigo de periódico|
|Title:||Optimization techniques for the estimation of the thickness and the optical parameters of thin films using reflectance data|
|Abstract:||The present work considers the problem of estimating the thickness and the optical constants (extinction coefficient and refractive index) of thin films from the spectrum of normal reflectance R. This is an ill-conditioned highly underdetermined inverse problem. The estimation is done in the spectral range where the film is not opaque. The idea behind the choice of this particular spectral range is to compare the film characteristics retrieved from transmittance T and from reflectance data. In the first part of the paper a compact formula for R is deduced. The approach to deconvolute the R data is to use well-known information on the dependence of the optical constants on photon energy of semiconductors and dielectrics and to formulate the estimation as a nonlinear optimization problem. Previous publications of the group on the subject provide the guidelines for designing the new procedures. The consistency of the approach is tested with computer-generated thin films and also with measured R and T spectral data of an a-Si:H film deposited onto glass. The algorithms can handle satisfactorily the problem of a poor photometric accuracy in reflectance data, as well as a partial linearity of the detector response. The results on gedanken films and on a-Si:H indicate a very good agreement between expected and retrieved values. (C) 2005 American Institute of Physics.|
|Editor:||Amer Inst Physics|
|Appears in Collections:||Unicamp - Artigos e Outros Documentos|
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