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Type: Artigo de periódico
Title: Synthetic melanin thin films: Structural and electrical properties
Author: da Silva, MIN
Deziderio, SN
Gonzalez, JC
Graeff, CFO
Cotta, MA
Abstract: Scanning probe microscopy was used to investigate the structural and electrical organization at the nanoscopic level of hydrated melanin thin films synthesized by oxidizing L-3-(3,4-dihydroxyphenyl)-alanine (L-dopa) in dimethyl sulfoxide. Atomic force microscopy (AFM) provided the morphologies of the L-dopa melanin films. Electrostatic force microscopy and conductive-AFM were used to spatially resolve the electrical properties of the material. Using a simple parallel plate capacitor model a method to measure the charge distribution on the sample was developed. The correlations between topography, electric charge, and current images of the sample demonstrated that the hydration process produces a restructuring of melanin observed not only through topographic variations, but also through the creation of areas with different electrical properties. (C) 2004 American Institute of Physics.
Country: EUA
Editor: Amer Inst Physics
Citation: Journal Of Applied Physics. Amer Inst Physics, v. 96, n. 10, n. 5803, n. 5807, 2004.
Rights: aberto
Identifier DOI: 10.1063/1.1803629
Date Issue: 2004
Appears in Collections:Unicamp - Artigos e Outros Documentos

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