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Type: Artigo de periódico
Title: Test suite minimization for testing in context
Author: Anido, R
Cavalli, AR
Lima, LP
Yevtushenko, N
Abstract: Testing a component embedded into a complex system, in which all other components are assumed fault-free, is known as embedded testing. This paper proposes a method for minimizing a test suite to perform embedded testing. The minimized test suite maintains the fault coverage of the original test suite with respect to faults within the embedded component. The minimization uses the fact that the system is composed of a fault-free context and a component under test, specified as communicating, possibly non-deterministic finite state machines (FSMs). The method is illustrated using an example of telephone services on an intelligent network architecture. Other applications of the proposed approach for testing a system of communicating FSMs are also discussed. Copyright (C) 2003 John Wiley Sons, Ltd.
Subject: finite state machine (FSM)
communicating FSMs
test suite
fault coverage
Country: Inglaterra
Editor: John Wiley & Sons Ltd
Citation: Software Testing Verification & Reliability. John Wiley & Sons Ltd, v. 13, n. 3, n. 141, n. 155, 2003.
Rights: fechado
Identifier DOI: 10.1002/stvr.275
Date Issue: 2003
Appears in Collections:Unicamp - Artigos e Outros Documentos

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