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|Type:||Artigo de periódico|
|Title:||Aligned Nafion (R) nanocomposites: Preparation and morphological characterization|
|Abstract:||A novel nanocomposite based on Nafron(R) (ionomer) and a layered silicate is studied. An innovative approach of processing a composite under electric field to induce orientation of the inorganic filler was carried out and accomplished in the present work. The morphology of orientated composites was analyzed by scanning electric potential microscopy (SEPM) and transmission electron microscopy (TEM). Films based on both plain ionomer and composite displayed fine contrast in SEPM, differentiating the phases, which could not be achieved using conventional atomic force microscopy. The orientation of the silicates in the composites is evident from the SEPM picture.|
scanning electric potential microscopy
|Editor:||Wiley-v C H Verlag Gmbh|
|Appears in Collections:||Artigos e Materiais de Revistas Científicas - Unicamp|
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