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|Type:||Artigo de periódico|
|Title:||Tridimension structural characterization of porous silicon by transmission electron microscopy and Raman scattering|
|Abstract:||Porous silicon structures are modeled based on their bidimensional images obtained by transmission electron microscopy and Raman spectroscopy. Connected (wire diameters similar to 15 Angstrom) and isolated silicon structures show different Raman line shapes. Comparing experimental spectra with those simulated by models appropriate for each type of structure, we obtain results consistent with cylindrical nanocrystals with a 3:1 length-to-diameter ratio and average diameters of similar to 50 Angstrom for both connected and isolated structures. Copyright (C) 1996 Elsevier Science Ltd|
scanning and transmission electron microscopy
|Editor:||Pergamon-elsevier Science Ltd|
|Appears in Collections:||Artigos e Materiais de Revistas Científicas - Unicamp|
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