Please use this identifier to cite or link to this item: http://repositorio.unicamp.br/jspui/handle/REPOSIP/76583
Type: Artigo de periódico
Title: Visualization of nanostructured porous silicon by a combination of transmission electron microscopy and atomic force microscopy
Author: Teschke, O
Abstract: The observation of red-, near-infrared, and nonphotoluminescent porous silicon structures both by transmission electron microscopy as well as by atomic force microscopy provides a consistent structural picture of the species responsible for the visible luminescence observed in these samples. The topography of the tops are seen in detail by atomic force microscopy, while the valleys are better observed by transmission electron microscopy; the observation techniques are therefore complementary. By measuring the apex radius of curvature of the atomic force microscope tip, it is possible to determine the porous silicon particle size by simple geometrical arguments. For red-photoluminescent porous silicon, the measured particle diameter using atomic force microscopy was 55 Angstrom and the particle height 4 Angstrom. The corrected particle diameter of 17 Angstrom is in close agreement with the 15 Angstrom value measured by transmission electron microscopy. (C) 1996 American Institute of Physics.
Editor: Amer Inst Physics
Rights: aberto
Identifier DOI: 10.1063/1.115607
Date Issue: 1996
Appears in Collections:Artigos e Materiais de Revistas Científicas - Unicamp

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