Please use this identifier to cite or link to this item: http://repositorio.unicamp.br/jspui/handle/REPOSIP/76395
Type: Artigo de periódico
Title: Ultrafast X-Ray Scattering of Xenon Nanoparticles: Imaging Transient States of Matter
Author: Bostedt, C
Eremina, E
Rupp, D
Adolph, M
Thomas, H
Hoener, M
de Castro, ARB
Tiggesbaumker, J
Meiwes-Broer, KH
Laarmann, T
Wabnitz, H
Plonjes, E
Treusch, R
Schneider, JR
Moller, T
Abstract: Femtosecond x-ray laser flashes with power densities of up to 10(14) W/cm(2) at 13.7 nm wavelength were scattered by single xenon clusters in the gas phase. Similar to light scattering from atmospheric microparticles, the x-ray diffraction patterns carry information about the optical constants of the objects. However, the high flux of the x-ray laser induces severe transient changes of the electronic configuration, resulting in a tenfold increase of absorption in the developing nanoplasma. The modification in opaqueness can be correlated to strong atomic charging of the particle leading to excitation of Xe4+. It is shown that single-shot single-particle scattering on femtosecond time scales yields insight into ultrafast processes in highly excited systems where conventional spectroscopy techniques are inherently blind.
Country: EUA
Editor: Amer Physical Soc
Rights: aberto
Identifier DOI: 10.1103/PhysRevLett.108.093401
Date Issue: 2012
Appears in Collections:Unicamp - Artigos e Outros Documentos

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