Please use this identifier to cite or link to this item: http://repositorio.unicamp.br/jspui/handle/REPOSIP/76395
Type: Artigo
Title: Ultrafast x-ray scattering of xenon nanoparticles: imaging transient states of matter
Author: Bostedt, C.
Eremina, E.
Rupp, D.
Adolph, M.
Thomas, H.
Hoener, M.
Castro, A. R. B. de
Tiggesbaumker, J.
Meiwes-Broer, K.-H.
Laarmann, T.
Wabnitz, H.
Plonjes, E.
Treusch, R.
Schneider, J. R.
Moller, T.
Abstract: Femtosecond x-ray laser flashes with power densities of up to 10(14) W/cm(2) at 13.7 nm wavelength were scattered by single xenon clusters in the gas phase. Similar to light scattering from atmospheric microparticles, the x-ray diffraction patterns carry information about the optical constants of the objects. However, the high flux of the x-ray laser induces severe transient changes of the electronic configuration, resulting in a tenfold increase of absorption in the developing nanoplasma. The modification in opaqueness can be correlated to strong atomic charging of the particle leading to excitation of Xe4+. It is shown that single-shot single-particle scattering on femtosecond time scales yields insight into ultrafast processes in highly excited systems where conventional spectroscopy techniques are inherently blind.
Subject: Constantes óticas
Raios X - Difração
Country: Estados Unidos
Editor: American Physical Society
Citation: Physical Review Letters. Amer Physical Soc, v. 108, n. 9, 2012.
Rights: aberto
Identifier DOI: doi.org/10.1103/PhysRevLett.108.093401
Address: https://journals.aps.org/prl/abstract/10.1103/PhysRevLett.108.093401
Date Issue: 2012
Appears in Collections:IFGW - Artigos e Outros Documentos

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