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Type: Artigo de periódico
Title: Routine control of accuracy in silicate rock analysis by X-ray fluorescence spectrometry
Author: Vendemiatto, MA
Enzweiler, J
Abstract: this study, we used the modified Horwitz expression (H-c = 0.01c(0.8495), which gives the precision as a function of concentration) to evaluate and control the accuracy of results of silicate rock analysis obtained by X-ray fluorescence spectrometry. This expression is currently used by the organisers of the GeoPT international proficiency tests, to assign the precision limits of each analyte and subsequently to evaluate the data provided by laboratories whose main application is geochemistry. Results for major and trace elements, determined in glass disk and pressed pellets, respectively, were evaluated. Nine international silicate rock reference materials were analysed and results were compared to the recommended values plus and minus the limits given by the above expression. Those limits are easily attained for most major elements, but not for trace elements. Sample preparation and sub-sampling contributions to precision were evaluated by analysis of an in-house reference sample. In our results, precision does not follow the Horwitz expression relationship with concentration. It is known that the final accuracy in XRF analysis depends strongly on instrumental settings and on the uncertainties associated with the certified or recommended values of the reference materials used to calibrate the spectrometer, but our results indicate that the precision expression can be useful, especially to inspect and correct calibration curves and to check routine instrumental accuracy.
Subject: quality control
reference materials
silicate rock analysis
major and trace element
Country: França
Editor: Geostandards
Citation: Geostandards Newsletter-the Journal Of Geostandards And Geoanalysis. Geostandards, v. 25, n. 41700, n. 283, n. 291, 2001.
Rights: fechado
Identifier DOI: 10.1111/j.1751-908X.2001.tb00604.x
Date Issue: 2001
Appears in Collections:Unicamp - Artigos e Outros Documentos

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