Please use this identifier to cite or link to this item:
Type: Artigo de periódico
Title: Single- and few-walled carbon nanotubes grown at temperatures as low as 450 degrees C: Electrical and field emission characterization
Author: Gohier, A
Djouadi, MA
Dubosc, M
Granier, A
Minea, TM
Sirghi, L
Rossi, F
Paredez, P
Alvarez, F
Abstract: Single-wall (SW-) and few-walled (FW-) carbon nanotubes (CNTs) were synthesized on aluminum/cobalt coated silicon at temperatures as low as 450 degrees C by plasma enhanced chemical vapor deposition technique (PECVD). The SWCNTs and FWCNTs grow vertically oriented and well separated from each other. The cold field emission studies of as-grown SWCNTs and FWCNTs showed low turn-on field emission threshold voltages, strongly dependent of the nanotubes morphology. Current-voltage curves of individual CNTs, measured by conductive atomic force microscopy (CAFM), showed an electrical resistance of about 90 K Omega, that is attributed mainly to the resistance of the contact between the CNTs and the conductive CAFM tip (Au and Pt).
Subject: few-walled carbon nanotubes
single-walled carbon nanotubes
low temperature
field emission
conductive atomic force microscopy
Country: EUA
Editor: Amer Scientific Publishers
Citation: Journal Of Nanoscience And Nanotechnology. Amer Scientific Publishers, v. 7, n. 9, n. 3350, n. 3353, 2007.
Rights: fechado
Identifier DOI: 10.1166/jnn.2007.883
Date Issue: 2007
Appears in Collections:Unicamp - Artigos e Outros Documentos

Files in This Item:
There are no files associated with this item.

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.