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|Type:||Artigo de periódico|
|Title:||Single- and few-walled carbon nanotubes grown at temperatures as low as 450 degrees C: Electrical and field emission characterization|
|Abstract:||Single-wall (SW-) and few-walled (FW-) carbon nanotubes (CNTs) were synthesized on aluminum/cobalt coated silicon at temperatures as low as 450 degrees C by plasma enhanced chemical vapor deposition technique (PECVD). The SWCNTs and FWCNTs grow vertically oriented and well separated from each other. The cold field emission studies of as-grown SWCNTs and FWCNTs showed low turn-on field emission threshold voltages, strongly dependent of the nanotubes morphology. Current-voltage curves of individual CNTs, measured by conductive atomic force microscopy (CAFM), showed an electrical resistance of about 90 K Omega, that is attributed mainly to the resistance of the contact between the CNTs and the conductive CAFM tip (Au and Pt).|
|Subject:||few-walled carbon nanotubes|
single-walled carbon nanotubes
conductive atomic force microscopy
|Editor:||Amer Scientific Publishers|
|Citation:||Journal Of Nanoscience And Nanotechnology. Amer Scientific Publishers, v. 7, n. 9, n. 3350, n. 3353, 2007.|
|Appears in Collections:||Unicamp - Artigos e Outros Documentos|
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