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|Type:||Artigo de periódico|
|Title:||X-ray absorption and x-ray fluorescence for the characterization of titanium oxide-modified HPLC silicas|
|Abstract:||Titanium oxide grafted on to the surfaces of chromatographic silica was investigated by x-ray fluorescence (XRF) and x-ray absorption (XAS) spectroscopy and the latter used before and after the extensive use of this material as a support for reversed-phase high-performance liquid chromatography (RP-HPLC). XRF indicated the formation of a complete 2: 1 monolayer whereas XAS suggested the presence of more than one titanium oxide structure. These structures show some slight modification after immobilization of PMOS and use in HPLC. Copyright (c) 2005 John Wiley & Sons, Ltd.|
|Editor:||John Wiley & Sons Ltd|
|Citation:||X-ray Spectrometry. John Wiley & Sons Ltd, v. 35, n. 2, n. 101, n. 105, 2006.|
|Appears in Collections:||Unicamp - Artigos e Outros Documentos|
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