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dc.contributor.CRUESPUniversidade Estadual de Campinaspt
dc.typeArtigo de periódicopt
dc.titleSensitivity of reliability-growth models to operational profile errors vs testing accuracypt
dc.contributor.authorPasquini, Apt
dc.contributor.authorCrespo, ANpt
dc.contributor.authorMatrella, Ppt
unicamp.authorUNIV ESTADUAL CAMPINAS,INST COMP,BR-13081970 CAMPINAS,SP,BRAZILpt
dc.subjectoperational profilept
dc.subjectreliability-growth modelpt
dc.subjectreliability modelingpt
dc.subjectrandom testingpt
dc.subjectsoftware faultpt
dc.subjectsoftware reliabilitypt
dc.subjectsoftware testingpt
dc.subject.wosSoftwarept
dc.description.abstractThis paper investigates: 1) the sensitivity of reliability-growth models to errors in the estimate of the operational profile (OP), and 2) the relation between this sensitivity and the testing accuracy. The investigation is based on the results of a case study in which several reliability-growth models are applied during the testing phase of a software system. The faults contained in the system are known in advance; this allows measurement of the software reliability-growth and comparison with the estimates provided by the models, Measurement & comparison are repeated for various OP, thus giving information about the effect of a possible error in the estimate of the OP. The results show that: 1) the predictive accuracy of the models is not heavily affected by errors in the estimate of the OP, and 2) this relation depends on the accuracy with which the software system has been tested.pt
dc.relation.ispartofIeee Transactions On Reliabilitypt_BR
dc.relation.ispartofabbreviationIEEE Trans. Reliab.pt
dc.publisher.cityNew Yorkpt
dc.publisherIeee-inst Electrical Electronics Engineers Incpt
dc.date.issued1996pt
dc.date.monthofcirculationDECpt
dc.identifier.citationIeee Transactions On Reliability. Ieee-inst Electrical Electronics Engineers Inc, v. 45, n. 4, n. 531, n. 540, 1996.pt
dc.language.isoenpt
dc.description.volume45pt
dc.description.issuenumber4pt
dc.description.initialpage531pt
dc.description.lastpage540pt
dc.rightsfechadopt
dc.rights.licensehttp://www.ieee.org/publications_standards/publications/rights/rights_policies.htmlpt
dc.sourceWeb of Sciencept
dc.identifier.issn0018-9529pt
dc.identifier.wosidWOS:A1996WH55800005pt
dc.identifier.doi10.1109/24.556576pt
dc.date.available2014-12-16T11:35:11Z
dc.date.available2015-11-26T17:30:01Z-
dc.date.accessioned2014-12-16T11:35:11Z
dc.date.accessioned2015-11-26T17:30:01Z-
dc.description.provenanceMade available in DSpace on 2014-12-16T11:35:11Z (GMT). No. of bitstreams: 1 WOSA1996WH55800005.pdf: 985966 bytes, checksum: b5fd631554ebf2da7078e26ac44edb2f (MD5) Previous issue date: 1996en
dc.description.provenanceMade available in DSpace on 2015-11-26T17:30:01Z (GMT). No. of bitstreams: 2 WOSA1996WH55800005.pdf: 985966 bytes, checksum: b5fd631554ebf2da7078e26ac44edb2f (MD5) WOSA1996WH55800005.pdf.txt: 44096 bytes, checksum: 10aa6095819a34da26d33783776dcd9f (MD5) Previous issue date: 1996en
dc.identifier.urihttp://www.repositorio.unicamp.br/jspui/handle/REPOSIP/71473pt_BR
dc.identifier.urihttp://www.repositorio.unicamp.br/handle/REPOSIP/71473
dc.identifier.urihttp://repositorio.unicamp.br/jspui/handle/REPOSIP/71473-
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