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|Type:||Artigo de periódico|
|Title:||Rochelle salt piezoelectric coefficients obtained by x-ray multiple diffraction|
|Author:||dos Santos, AO|
|Abstract:||In this paper, the theory of the method which uses the sensitivity and versatility of the multiple diffraction phenomenon to probe small lattice deformation induced by electric field (Avanci et al 1998 Phys. Rein Lett. 81 5426) was implemented to provide a relationship between the E-induced strain in the Rochelle salt (ferroelectric phase) crystal and the shift in the Renninger scan peak position. From that, all piezoelectric coefficients in a piezoelectric tensor row (d(21) = 7.0(6) x 10(-10) CN-1, d(22) = 2.2 (9) x 10(-9) CN-1, d(23) = 2.1(9) x 10(-9)CN(-1) and d(25) = 3.7(8) x 10(-11) CN-1) were determined by using the primary reflections (6 0 0) and (8 0 0) found as the best choices for the experiments with E parallel to the [0 1 0] direction (the b-axis).|
|Editor:||Iop Publishing Ltd|
|Appears in Collections:||Artigos e Materiais de Revistas Científicas - Unicamp|
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