Please use this identifier to cite or link to this item: http://repositorio.unicamp.br/jspui/handle/REPOSIP/66528
Type: Artigo de periódico
Title: EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE INVESTIGATION OF SHORT-RANGE ORDER IN A-GE1-XSNX ALLOYS
Author: PASCARELLI, S
BOSCHERINI, F
MOBILIO, S
ZANATTA, AR
MARQUES, FC
CHAMBOULEYRON, I
Abstract: The local environments of germanium and tin atoms in a-Ge1-xSnx alloys (0.0 less-than-or-equal-to x less-than-or-equal-to 0.2) have been investigated by measuring the extended x-ray-absorption fine structure (EXAFS) at the Ge K edge and at the Sn L(III) edge. The measured EXAFS at both edges could be described only by assuming the presence of a mixed first coordination shell composed of both Ge and Sn atoms. Coordination numbers, bond lengths, and relative mean-square displacement values characterizing the first coordination shell around Ge and Sn atoms were obtained. It has been found that the Sn atoms are randomly distributed in the amorphous Ge network, and that metallic Sn segregation may be excluded throughout the concentration range studied. The Ge-Ge, Ge-Sn, and Sn-Sn distances were found to be independent of concentration and equal to 2.47, 2.67, and 2.80 angstrom, respectively. The random atomic arrangement observed is an indication that, in this concentration range and under the growth conditions adopted, the incorporation of Sn in the amorphous Ge matrix is dominated by chemical interactions, regardless of the atomic-size difference between the two atoms.
Country: EUA
Editor: American Physical Soc
Rights: aberto
Identifier DOI: 10.1103/PhysRevB.46.6718
Date Issue: 1992
Appears in Collections:Unicamp - Artigos e Outros Documentos

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