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|Type:||Artigo de periódico|
|Title:||Exchange bias in Fe/EuTe(111) bilayers|
|Abstract:||We report on the investigation of the exchange bias effect in Fe layers on EuTe(111), an antiferromagnetic semiconductor. For this ferromagnet (FM)/semiconducting antiferromagnet (AFM) exchange bias system, we have found positive and negative exchange bias effect (EB). Fresh samples exhibit positive EB, independently of the applied cooling field, indicating antiferromagnetic coupling between the FM and the AFM layers at the Fe/EuTe(111) interface. The change in EB with time, from positive EB for fresh samples to negative EB after short time,is attributed to aging effects at the Fe/EuTe interface. (c) 2007 American Institute of Physics.|
|Editor:||Amer Inst Physics|
|Citation:||Journal Of Applied Physics. Amer Inst Physics, v. 102, n. 3, 2007.|
|Appears in Collections:||Unicamp - Artigos e Outros Documentos|
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