Please use this identifier to cite or link to this item: http://repositorio.unicamp.br/jspui/handle/REPOSIP/64610
Type: Artigo de periódico
Title: ELECTROREFLECTANCE STUDY OF THE E(1) AND E(0) OPTICAL-TRANSITIONS IN THIN GE/SI SUPERLATTICES
Author: RODRIGUES, PAM
CERDEIRA, F
CARDONA, M
KASPER, E
KIBBEL, H
Abstract: We report low temperature (77 K) electroreflectance measurements on a series of Ge(n) Si(m) strain-symmetrized superlattices. The results obtained for samples with n + m less-than-or-equal-to 10 are consistent with band structure calculations performed using the linear muffin-tin orbitals method as well as data from previous ellipsometric measurements. Results for superlattices with n + m greater-than-or-equal-to 20 can be explained by a straightforward extension of this conceptual scheme.
Country: Inglaterra
Editor: Pergamon-elsevier Science Ltd
Rights: fechado
Identifier DOI: 10.1016/0038-1098(93)90830-G
Date Issue: 1993
Appears in Collections:Unicamp - Artigos e Outros Documentos

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