Please use this identifier to cite or link to this item:
|Type:||Artigo de periódico|
|Title:||CHARACTERIZATION OF RESONANT-TUNNELING PATHS IN CURRENT-VOLTAGE CHARACTERISTICS LINE-SHAPES|
|Abstract:||We analyze the current density-voltage characteristics of double-barrier tunneling diodes, with different spacer layers, within the framework of a Poisson solver together with a coherent tunneling approximation for transmission probabilities. We show that varying the spacer layer thickness, together with barrier heights, changes dramatically the current density-voltage characteristics line shape, which is revealed to be an important qualitative signature of the tunneling paths involved in the double-barrier diodes under operation. (C) 1995 American Institute of Physics.|
|Editor:||Amer Inst Physics|
|Citation:||Applied Physics Letters. Amer Inst Physics, v. 67, n. 18, n. 2675, n. 2677, 1995.|
|Appears in Collections:||Unicamp - Artigos e Outros Documentos|
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.