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dc.contributor.CRUESPUniversidade Estadual de Campinaspt_BR
dc.typeArtigo de periódicopt_BR
dc.titleNovel boundary condition for the finite-element solution of arbitrary planar junctionspt_BR
dc.contributor.authorDavanco, MIpt_BR
dc.contributor.authorRubio-Mercedes, CEpt_BR
dc.contributor.authorHernandez-Figueroa, HEpt_BR
unicamp.authorUniv Estadual Campinas, Sch Elect & Comp Engn, Dept Microwaves & Opt, BR-13083970 Campinas, SP, Brazilpt_BR
dc.subjectfinite-elementspt_BR
dc.subjectmode-matching techniquept_BR
dc.subjectperfectly matched layerpt_BR
dc.subjectplanar junctionspt_BR
dc.subjectplanar waveguidespt_BR
dc.subjectwaveguide discontinuitiespt_BR
dc.subject.wosBeam-propagation Methodpt_BR
dc.subject.wosIntegrated-opticspt_BR
dc.description.abstractA novel boundary condition for a two-dimensional finite-element method (2D-FEM) is developed to simulate accessing waveguides to planar optical junctions, This new boundary condition is based on a paraxial approximation to the field's derivatives over the junction's ports, The formulation is very easily adapted within the 2D-FEM framework while providing good simulation results. Two examples are provided to show the applicability and reliability of the present method: a waveguide step discontinuity and a sharp waveguide bend.pt
dc.relation.ispartofIeee Photonics Technology Letterspt_BR
dc.relation.ispartofabbreviationIEEE Photonics Technol. Lett.pt_BR
dc.publisher.cityNew Yorkpt_BR
dc.publisher.countryEUApt_BR
dc.publisherIeee-inst Electrical Electronics Engineers Incpt_BR
dc.date.issued2001pt_BR
dc.date.monthofcirculationJANpt_BR
dc.identifier.citationIeee Photonics Technology Letters. Ieee-inst Electrical Electronics Engineers Inc, v. 13, n. 1, n. 46, n. 48, 2001.pt_BR
dc.language.isoenpt_BR
dc.description.volume13pt_BR
dc.description.issuenumber1pt_BR
dc.description.firstpage46pt_BR
dc.description.lastpage48pt_BR
dc.rightsfechadopt_BR
dc.rights.licensehttp://www.ieee.org/publications_standards/publications/rights/rights_policies.htmlpt_BR
dc.sourceWeb of Sciencept_BR
dc.identifier.issn1041-1135pt_BR
dc.identifier.wosidWOS:000167071000016pt_BR
dc.identifier.doi10.1109/68.903216pt_BR
dc.date.available2014-11-15T02:19:03Z
dc.date.available2015-11-26T16:30:16Z-
dc.date.accessioned2014-11-15T02:19:03Z
dc.date.accessioned2015-11-26T16:30:16Z-
dc.description.provenanceMade available in DSpace on 2014-11-15T02:19:03Z (GMT). No. of bitstreams: 1 WOS000167071000016.pdf: 118569 bytes, checksum: a2f8c04a013664abe2453b6772c5237a (MD5) Previous issue date: 2001en
dc.description.provenanceMade available in DSpace on 2015-11-26T16:30:16Z (GMT). No. of bitstreams: 2 WOS000167071000016.pdf: 118569 bytes, checksum: a2f8c04a013664abe2453b6772c5237a (MD5) WOS000167071000016.pdf.txt: 10453 bytes, checksum: 1aeb92589c1d30e302ccfa10991e70f4 (MD5) Previous issue date: 2001en
dc.identifier.urihttp://www.repositorio.unicamp.br/jspui/handle/REPOSIP/62137pt_BR
dc.identifier.urihttp://www.repositorio.unicamp.br/handle/REPOSIP/62137
dc.identifier.urihttp://repositorio.unicamp.br/jspui/handle/REPOSIP/62137-
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