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Type: Artigo de periódico
Title: Nonlinear parametric test
Author: Teani, CRN
Jorge, AM
Abstract: Using the nonlinear behavior of the structural components within the integrated circuit, the state space may be studied, and one observable state trajectory can identify parametric variations through Poincare maps. An OpAmp parametric test, using the proposed methodology, is presented.
Subject: integrated circuits test
nonlinear behavior
virtual instrumentation
Country: EUA
Editor: Ieee-inst Electrical Electronics Engineers Inc
Rights: fechado
Identifier DOI: 10.1109/TIM.2002.808024
Date Issue: 2003
Appears in Collections:Unicamp - Artigos e Outros Documentos

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