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|Type:||Artigo de periódico|
|Title:||Dielectric exchange-force effect on the rupture force of adsorbed bilayers of self-assembled surfactant films|
de Souza, EF
|Abstract:||We measured and formulated dielectric exchange forces between adsorbed layers of self-assembled surfactant films and atomic-force microscope tips in water. The dielectric exchange-force model is in agreement with the observation that the surfactant-layer rupture forces (tip-applied force necessary to obtain tip/substrate contact) are smaller in the thickest layers, where the compactness of the adsorbed film results in the smallest values of the dielectric permittivity. Within experimental accuracy, a dielectric permittivity value of similar to4 for bilayers and of similar to 36 for monolayers is found. (C) 2001 American Institute of Physics.|
|Editor:||Amer Inst Physics|
|Appears in Collections:||Unicamp - Artigos e Outros Documentos|
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