Please use this identifier to cite or link to this item: http://repositorio.unicamp.br/jspui/handle/REPOSIP/61476
Type: Artigo de periódico
Title: Determination of thickness, dielectric constant of thiol films, and kinetics of adsorption using surface plasmon resonance
Author: Damos, FS
Luz, RCS
Kubota, LT
Abstract: This paper describes the formation of a self-assembled monolayer of 11-mercaptoundecanoic acid (MUA) under different concentrations on a gold sensor disk, monitoring in situ and in real time using surface plasmon resonance spectroscopy (SPR). The film thickness and dielectric constant were determined for a fully formed monolayer using one-color approach SPR. The kinetic studies of the film formation in ethanol solution indicated that the self-assembled monolayer is formed in a two-step adsorption process. In this sense, this unpublished route was applied on the basis of a model where many molecules are adsorbed at an initial step and then can be desorbed and/or rearranged to form a perfect monolayer.
Country: EUA
Editor: Amer Chemical Soc
Rights: fechado
Identifier DOI: 10.1021/la0487038
Date Issue: 2005
Appears in Collections:Unicamp - Artigos e Outros Documentos

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