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|Type:||Artigo de periódico|
|Title:||IonRock: software for solving strain gradients of ion-implanted semiconductors by X-ray diffraction measurements and evolutionary programming|
|Abstract:||We present a program that uses an optimization algorithm to fit rocking curves of ion-implanted semiconductors. This is an inverse problem that cannot be solved by simple methods. However, using recursion formulae for rocking curve calculations and a model of ion distribution after implantation, it is possible to fit experimental data with a general-purpose optimization method. In our case, we use a modified version of the genetic algorithm, which has been shown to be a good technique for this problem. The program also calculates rocking curves for a given ion profile, such as those generated by ion implantation simulation programs. (C) 2004 Elsevier B.V. All rights reserved.|
|Editor:||Elsevier Science Bv|
|Citation:||Computer Physics Communications. Elsevier Science Bv, v. 160, n. 2, n. 158, n. 165, 2004.|
|Appears in Collections:||Unicamp - Artigos e Outros Documentos|
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