Please use this identifier to cite or link to this item: http://repositorio.unicamp.br/jspui/handle/REPOSIP/60655
Type: Artigo de periódico
Title: INVESTIGATIONS ON ANISOTROPIC SURFACE-ROUGHNESS OF THIN-FILMS USING X-RAY SPECULAR REFLECTION TOPOGRAPHY
Author: CHANG, SL
CARDOSO, LP
MOEHLECKE, S
Country: Holanda
Editor: Elsevier Science Bv
Rights: fechado
Identifier DOI: 10.1016/0022-0248(85)90328-8
Date Issue: 1985
Appears in Collections:Unicamp - Artigos e Outros Documentos

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