Please use this identifier to cite or link to this item: http://repositorio.unicamp.br/jspui/handle/REPOSIP/58386
Type: Artigo de periódico
Title: Pseudoscopic imaging in a double diffraction process with a slit: critical point properties
Author: Lunazzi, JJ
Rivera, NI
Abstract: Pseudoscopic (inverted depth) images that keep a continuous parallax were shown to be possible by use of a double diffraction process intermediated by a slit. One diffraction grating directing light to the slit acts as a wavelength encoder of views, while a second diffraction grating decodes the projected image. The process results in the enlargement of the image under common white light illumination up to infinite magnification at a critical point. We show that this point corresponds to another simple-symmetry object-observer system. Our treatment allows us to explain the experience by just dealing with main ray directions. (C) 2006 Optical Society of America.
Country: EUA
Editor: Optical Soc Amer
Rights: aberto
Identifier DOI: 10.1364/JOSAA.23.001021
Date Issue: 2006
Appears in Collections:Unicamp - Artigos e Outros Documentos

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