Please use this identifier to cite or link to this item:
|Type:||Artigo de periódico|
|Title:||Three-dimensional mapping of the strain anisotropy in self-assembled quantum-wires by grazing incidence x-ray diffraction|
|Abstract:||Three-dimensional strain mapping of InAs self-assembled nanowires on an InP substrate using grazing incidence x-ray diffraction is reported. A remarkable anisotropy was observed for the strain components, parallel [-220] and perpendicular  to the wire axis. The highest strain relaxation was measured along the  direction. The relationship between the interatomic distances along the [-220] and  directions, for each z position (height) in the nanostructure, was obtained by angular scans in the vicinity of the (040) reciprocal lattice point. (C) 2004 American Institute of Physics.|
|Editor:||Amer Inst Physics|
|Appears in Collections:||Unicamp - Artigos e Outros Documentos|
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.