Please use this identifier to cite or link to this item: http://repositorio.unicamp.br/jspui/handle/REPOSIP/57468
Type: Artigo de periódico
Title: CRYSTALLITE SIZE DETERMINATION IN MU-C-GE FILMS BY X-RAY-DIFFRACTION AND RAMAN LINE-PROFILE ANALYSIS
Author: DOSSANTOS, DR
TORRIANI, IL
Abstract: Experimental Raman spectra were used to evaluate the average crystallite size of muc-Ge films. The experimental curves were fitted with a theoretical expression obtained by Richter et al. assuming a Gaussian size distribution. X-Ray Diffraction line profile analysis was performed to obtain crystallite size and shape information. Comparison of the results from both techniques proves that the crystallite dimensions obtained can only be expected to be similar in those cases in which the approximation of ''spherical'' grains is valid.
Country: Inglaterra
Editor: Pergamon-elsevier Science Ltd
Rights: fechado
Identifier DOI: 10.1016/0038-1098(93)90021-E
Date Issue: 1993
Appears in Collections:Unicamp - Artigos e Outros Documentos

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