Please use this identifier to cite or link to this item: http://repositorio.unicamp.br/jspui/handle/REPOSIP/57290
Type: Artigo de periódico
Title: Correlation study between VAD preform deposition surface and germanium doping profiles
Author: dos Santos, JS
Ono, E
Gusken, E
Suzuki, CK
Abstract: The refractive index profile of germanium doped preforms for optical fibers is determined by the radial distribution of germanium concentration. Knowing that there is a correlation between the germanium doping profile and the deposition surface profile of vapor-phase axial deposition (VAD) preforms, the study of this correlation has been carried out in order to estimate, indirectly, the refractive index profile of VAD preforms for optical fibers during the deposition stage. This correlation was studied through the parameterization of the preform deposition surface using two parameters: the power law index profile that best fits the preform bottom profile (alpha) and the axial distance from the bottom tip to a reference height (h). A range of values of these parameters to produce VAD preforms with standard and special doping profiles has been presented. Preforms with triangular index profile can be fabricated with alpha and h values of about 2.0 and 5.0 mm, respectively, and preforms with parabolic index profiles can be produced with alpha and h values of about 2.0 and 4.0 mm, respectively.
Subject: germanium doping profile
preform deposition surface
refractive index profile
VAD technique
Country: EUA
Editor: Ieee-inst Electrical Electronics Engineers Inc
Rights: aberto
Identifier DOI: 10.1109/JLT.2005.861936
Date Issue: 2006
Appears in Collections:Unicamp - Artigos e Outros Documentos

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