Please use this identifier to cite or link to this item: http://repositorio.unicamp.br/jspui/handle/REPOSIP/57081
Type: Artigo de periódico
Title: Controlled molecular alignment in phthalocyanine thin films on stepped sapphire surfaces
Author: Osso, JO
Schreiber, F
Kruppa, V
Dosch, H
Garriga, M
Alonso, MI
Cerdeira, F
Abstract: We report a detailed study of the growth and structure of thin films of copper hexadecafluorophthalocyanine (F16CuPc) on sapphire. These films show very good out of plane order and have X-ray rocking widths of around 0.02degrees. If prepared under suitable conditions of A-plane sapphire substrates, the molecules align without significant azimuthal dispersion. Growth on MgO (001) and oxidized silicon wafers resulted in a comparable out-of-plane structure, but showed no azimuthal order. We find that he azimuthal alignment on sapphire is induced by the step edges along the c-axis of the sapphire, which serve as templates for the growth. For growth at different substrate temperatures, we find a monotonic change of the molecular out-of-plane tilt angle, as obtained from Raman scattering, which is accompanied by a change of the out-of-plane lattice parameter.
Country: Alemanha
Editor: Wiley-v C H Verlag Gmbh
Rights: fechado
Identifier DOI: 10.1002/1616-3028(20020618)12:6/7<455
Date Issue: 2002
Appears in Collections:Unicamp - Artigos e Outros Documentos

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