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|Type:||Artigo de periódico|
|Title:||Analytic CRS stack formula for a 2D curved measurement surface and finite-offset reflections|
|Abstract:||The 2D Common-Reflection-Surface (CRS) stack provides a multiparametric data-driven stacking and kinematic-wavefield-attribute extraction approach. This helps to address various aspects of improving seismic stacks and solving inverse kinematic and dynamic problems such as amplitude-versus-offset (AVO) or amplitude-versus-angle (AVA) analysis. Originally developed for simulating 2D zero-offset sections from pre-stack data recorded on a planar measurement surface, a 2D CRS Stack moveout formula is now presented for a central ray with an arbitrary shot-receiver separation and a curved measurement surface. The proposed extension is designed to handle (a) land data in which the topographic features of the seismic acquisition surface is accounted for to yield reliable imaging results; (b) different level shooting and recording, as considered in ocean-bottom seismic (OBS) surveys and (c) surface-to-borehole seismic profiling. From the knowledge of the surface topography and the near-surface velocity in the vicinity of the source and the receiver, the new CRS stack moveout formula requires the search of five unknown stacking parameters. These can be directly extracted from the multi-coverage seismic data by means of a suitable coherence analysis performed on the searched-for reflections. The extracted CRS parameters can be used for deriving kinematic attributes that relate to the wave propagation within the (unknown) subsurface medium. One of these is the inline geometrical spreading factor, for which a simple expression is provided. The 5-parameter formula is designed to handle P-P, P-S, S-S and S-P reflections.|
|Subject:||curved acquisition topography|
multi-coverage reflection data
|Citation:||Journal Of Seismic Exploration. Geophysical Press, v. 10, n. 41699, n. 245, n. 262, 2001.|
|Appears in Collections:||Unicamp - Artigos e Outros Documentos|
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