Please use this identifier to cite or link to this item: http://repositorio.unicamp.br/jspui/handle/REPOSIP/54581
Type: Artigo de periódico
Title: Analysis of nanocrystalline coatings of tin oxides on glass by atomic force microscopy
Author: Baranauskas V
Santos, TEA
Schreiner, MA
Zhao, JG
Mammana, AP
Mammana, CIZ
Abstract: Atomic force microscopy (AFM) was used to study the relation between the surface morphology of SnO(2) coatings with their room-temperature resistivities. A hot-plate chemical vapor deposition system fed with vapors of tin tetrachloride and methyl alcohol diluted in a nitrogen gas carrier was used to deposit the SnO(2) films on soda-lime glass. It was found that above a critical deposition temperature (T = 643 K), the film resistivity reaches its minimum value, which is almost constant over the wide range of the SnCl(4) vapor concentration used. AFM revealed that the increase in the deposition temperature increased the grain size and that the surface roughness increases with greater SnCl(4) vapor concentration. Therefore films of the same resistivity (deposited at the same temperature) may have different roughnesses. (C) 2002 Elsevier Science B.V. All rights reserved.
Subject: tin oxide
stannic oxide
SnO(2)
atomic force microscopy
surface roughness
Country: Suíça
Editor: Elsevier Science Sa
Rights: fechado
Identifier DOI: 10.1016/S0925-4005(02)00058-8
Date Issue: 2002
Appears in Collections:Artigos e Materiais de Revistas Científicas - Unicamp

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