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Type: Artigo de periódico
Title: An interference method for the determination of thin film anisotropy
Author: Surdutovich, GI
Kolenda, J
Fragalli, JF
Misoguti, L
Vitlina, R
Baranauskas, V
Abstract: A new method of determination of thin film anisotropy from the angular dependence of the reflectance interference patterns for s- and p-polarized light is proposed and tested experimentally. The method is based on the different phase angle dependence of polarized light on the incident angle. As a result, the interference patterns of the reflected s- and p-polarized light beams exhibit a different number of oscillations in their angular dependence. The high sensitivity of the method is shown by its application to the interference patterns of a specially prepared multilayer structure with a calculated anisotropy.
Subject: anisotropy
Country: Suíça
Editor: Elsevier Science Sa Lausanne
Citation: Thin Solid Films. Elsevier Science Sa Lausanne, v. 279, n. 41671, n. 119, n. 123, 1996.
Rights: fechado
Identifier DOI: 10.1016/0040-6090(95)08165-8
Date Issue: 1996
Appears in Collections:Unicamp - Artigos e Outros Documentos

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